Sick Contrast Sensors 13 mm, LED IO-Link, PNP/NPN, 100 mA, 10.8 → 28.8 V dc, IP67

Outstanding performance for a variety of applications, even in difficult conditions: The KTX contrast sensor with familiar hole pattern, high precision RGB LED and VISTAL® housing impresses with TwinEye-Technology, color mode, high switching frequency, excellent grayscale resolution, 7-segment display, and IO-Link. The response time of 10 μs and a jitter of 5 μs ensure accurate detection of contrast differences, even at high machine speeds.

The various teach in procedures, integrated color mode, and variable sensor settings ensure greater flexibility during commissioning and increased process stability. The KTX contrast sensor provides additional diagnostics and analysis data via IO-Link. The KTX contrast sensor does the basics and even more.

TwinEye Technology for increased depth of field and sensing distance tolerance
50 kHz switching frequency and 5 μs jitter
Large dynamic range means reliable detection of contrasts on glossy materials
7-segment display
Color mode
Mounting feedback
IO-Link and automation functions
Flexible sensor setting thanks to various sensor parameters

1:1 replacement for existing KT series - assembly compatibility
TwinEye-Technology for better performance on glossy or fluttery materials, thereby resulting in fewer machine downtimes and more process stability
Multi-functional sensor adjustment for individual sensor adjustment
Excellent contrast resolution and a large dynamic range for good performance on complex materials
High flexibility thanks to a range of teach-in procedures
Integrated color mode - stable detection even with complex color differences
Job storage in sensor - flexible process design and format change
Diagnostics and visualization as well as easy format change via IO-Link

Fields of applications
Applications in which contrast is a distinguishing feature
Print mark detection for controlling the cutting process
Print control in the printing industry
Positioning tubes
Label alignment on bottles
Splice detection in packaging an